RF system validation relies heavily on prototyping, chamber, and over-the-air measurements, yet physical testing cannot feasibly capture the vast majority of practical edge cases such as complex device orientation, dynamic blockage, and multipath environments.
Remcom's scalable automation workflow integrates XFdtd® and Wireless InSite® to bridge the gap between component-level RF and channel-level performance.
This presentation demonstrates an automated pipeline where antenna geometries are simulated in XFdtd, generating Huygens surfaces and S-parameters to analyze in-situ performance with Wireless InSite. This seamless integration allows engineers to model site-specific propagation across complex indoor, urban, and NTN scenarios using the exact near-field characteristics of the device.
The workflow produces accurate, large, labeled datasets linking antenna parameters to channel metrics (path loss, delay spread, AoA/AoD). Learn how to use this RF digital twin to overcome laboratory limitations, reducing testing burden while training robust AI/ML models for RF system optimization and algorithm design for wireless chipsets.